The Defect Characterization of Rare-earth Intensifying Screen Material by Doppler Broadening Positron Annihilation Spectrometer
نویسندگان
چکیده
منابع مشابه
Defect Characterization in SiGe/SOI Epitaxial Semiconductors by Positron Annihilation
The potential of positron annihilation spectroscopy (PAS) for defect characterization at the atomic scale in semiconductors has been demonstrated in thin multilayer structures of SiGe (50 nm) grown on UTB (ultra-thin body) SOI (silicon-on-insulator). A slow positron beam was used to probe the defect profile. The SiO(2)/Si interface in the UTB-SOI was well characterized, and a good estimation of...
متن کاملPositron annihilation studies in binary solid solutions of metal betadiketonates, using lifetime and Doppler broadening spectroscopies
S Positron annihilation lifetime (LS) and Doppler broadening annihilation kadiation lineshape (DBARL) spectroscopies measurements were performed in several binary solid solutions of the general formula M(l-x,Gfx,L3 , where M = Al(II1) , Ga(II1) , or In(II1) , as matrix; G = Cr (111) , Mn (111) , Fe (111) , co (111) , Ru (111) , Rh(III), and Ir(III), as guest molecules, L = acetylacetone (acac) ...
متن کاملDoppler broadening of in-flight positron annihilation radiation due to electron momentum.
We report the first observation of electron momentum contributions to the Doppler broadening of radiation produced by in-flight two-photon annihilation in solids. In these experiments an approximately 2.5 MeV positron beam impinged on thin polyethylene, aluminum, and gold targets. Since energetic positrons easily penetrate the nuclear Coulomb potential and do not cause a strong charge polarizat...
متن کاملStudy the Properties of Cu-Zn Ferrite Substituted with Rare Earth Ions by Using Positron Annihilation Analysis
Positron annihilation lifetime spectroscopy (PALS) is a direct probe of size and concentration of nano-scale defects in materials, because it is very sensitive to electron density. The lifetime of positron ( ) and its intensity (I) can be used to characterize the defects concentration. In the present work, PALS has been applied to measure the variation of positron lifetime parameters for polycr...
متن کاملDeconvolution of positron annihilation coincidence Doppler broadening spectra using an iterative projected Newton method with non-negativity constraints
A generalized least-square method with Tikonov–Miller regularization and non-negativity constraints has been developed for deconvoluting two-dimensional coincidence Doppler broadening spectroscopy ͑CDBS͒ spectra. A projected Newton algorithm is employed to solve the generalized least-square problem. The algorithm has been tested on Monte Carlo generated spectra to find the best regularization par...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Korean Journal of Materials Research
سال: 2005
ISSN: 1225-0562
DOI: 10.3740/mrsk.2005.15.6.370